Auto Generate Testpoint

The Auto Generate command allows new testpoints to be generated, or testpoint attributes to be added which correspond to the number of testpoints that are set for each net. See: Automatically Generating or Deleting Testpoints. Launch this command by clicking Net /Route > Testpoint > Testpoint split button > Auto Generate on the eCADSTAR PCB Editor ribbon. The Auto Generate Testpoint dialog is displayed. This command is only available in 2D View mode.

Command dialog

Target Padstack

Value   Description
Padstack box   When the dialog is opened, padstacks are listed with a value of 0 for both Minimum conductor size and Minimum resist size, unless previously set.
  Delete Deletes the padstack that you select in the Padstack box. You can select multiple padstacks using the Ctrl or Shift keys.

Minimum conductor size

Value Description
Real number greater than 0. For the padstacks where testpoints are generated, this is the minimum size of the test point land.

Minimum resist size

ValueDescription
Real number greater than 0.For the padstacks where testpoints are generated, this is the minimum clearance of the resist.

Through hole pins

ValueDescription
ONThrough-hole pins are targeted.
OFFThrough-hole pins are not targeted.

Surface mount pins

ValueDescription
ONSurface mount pins are targeted.
OFFSurface mount pins are not targeted.

Vias

ValueDescription
ONRoute vias are targeted.
OFFRoute vias are not targeted.

Surface mount

ValueDescription
Padstack boxSpecify the padstack that is used for testpoint generation. This provides the clearances that are required when probing the testpoint pad.

Rule Library vias

Value Description
Via box Allows you to restrict the list of vias to those defined as “allowed” in the Available padstacks box, in the Rule Editor Dialog: Vias tab.
 ONIf selected, then vias are listed only if they are defined as “allowed” in the Available padstacks box, in the Rule Editor Dialog: Vias tab.
 OFFIf selected, then vias are listed that are already used in the board.

Via

ValueDescription
Via boxSelect the via that is used for testpoint generation. This box is populated according to the selection in the Rule Library vias field, above.

On pattern

ValueDescription
ONA testpoint is generated on the pattern.
OFFA testpoint is not generated on the pattern.

Fan-out

ValueDescription
ONTestpoints are generated around component pins.
OFFTestpoints are not generated around component pins.

Select mode

Allows you to specify the type of object for which testpoints are generated. The objects that are associated with the selected mode are highlighted on the canvas when you point the cursor at them.

ValueDescription
NormalOn the canvas, select a track or track segment, padstack, pad or via. The button is made unavailable.
NetClick and select a net in the displayed Net dialog. Multiple nets can be selected using the Ctrl or Shift keys. The nets that you select are highlighted on the canvas. Alternatively, select the required nets by clicking them on the canvas.
ComponentOn the canvas, select a component. The button is made unavailable.
Unconnected pinClick and select an unconnected pin in the displayed Unconnected pin dialog. Multiple items can be selected using the Ctrl or Shift keys. The components associated with the unconnected pins that you select are highlighted on the canvas. Alternatively, select unconnected pins by clicking them on the canvas.
  • If Net is selected in the Select mode box, then the Net dialog is displayed when you click this button. This dialog allows you to select a net. You can select multiple items using the Ctrl or Shift keys.
  • If Unconnected pin is selected in the Select mode box, then the Unconnected pin dialog is displayed when you click this button. The Unconnected pin dialog allows you to select an unconnected pin. Select multiple items using the Ctrl or Shift keys.

Around component

ValueDescription
ONIf Selection mode is set to Component, a testpoint is generated in the vicinity of the component.
OFFIf Selection mode is set to Component, a testpoint is generated in the component area.

Testpoint side

ValueDescription
Side ATestpoints are generated on side A, when generating on component pins.
Side BTestpoints are generated on side B, when generating on component pins.
Prioritize Side A/Prioritize Side BWhen the component placement side is side A:
When there are pads (such as DIP components) on side B:Generated on side B.
When there are no pads (such as surface mount components) on side B:Generated on side A.
When the component placement side is side B:
When there are pads (such as DIP components) on side A:Generated on side A.
When there are no pads (such as surface mount components) on side A:Generated on side B.

DRC for testpoint

ValueDescription
DetailDisplays the DRC for Testpoint dialog.

Reference name parameters

ValueDescription
DetailDisplays the Reference name parameters dialog. This dialog allows you to generate testpoint reference names.

Highlight nets requiring a testpoint

ValueDescription
ONNets are highlighted where the number of testpoints generated for the net is less than the number of required testpoints.
OFFNets are not highlighted where the number of testpoints generated for the net is less than the number of required testpoints.

 

ValueDescription
ExecuteTestpoints are generated, or testpoint attributes are added. The Auto GenerateTestpoint dialog remains open.
ExitCloses the Auto GenerateTestpoint dialog without generating testpoints or adding testpoint attributes.