Auto Generate Testpoint
The Auto Generate
command allows new testpoints to be generated, or testpoint attributes
to be added which correspond to the number of testpoints that are set
for each net. See: Automatically
Generating or Deleting Testpoints. Launch this command by clicking
split
button on the eCADSTAR PCB Editor
ribbon. The Auto Generate Testpoint dialog
is displayed. This command is only available in 2D
View mode.
Command dialog
Target Padstack
Value |
|
Description |
Padstack box |
|
When the dialog is opened, padstacks are listed with a value
of 0 for both Minimum conductor size
and Minimum resist size, unless
previously set. |
|
Delete
|
Deletes the padstack that you select in the Padstack
box. You can select multiple padstacks using the Ctrl or Shift
keys. |
Minimum conductor size
Value |
Description |
Real number greater than 0. |
For the padstacks where testpoints are generated, this is the
minimum size of the test point land. |
Minimum resist size
Value | Description |
---|
Real number greater than 0. | For the padstacks where testpoints are generated, this is the
minimum clearance of the resist. |
Through
hole pins
Value | Description |
---|
ON | Through-hole pins are targeted. |
OFF | Through-hole pins are not targeted. |
Surface mount
pins
Value | Description |
---|
ON | Surface mount pins are targeted. |
OFF | Surface mount pins are not targeted. |
Vias
Value | Description |
---|
ON | Route vias are targeted. |
OFF | Route vias are not targeted. |
Surface mount
Value | Description |
---|
Padstack box | Specify the padstack that is used for testpoint generation.
This provides the clearances that are required when probing the
testpoint pad. |
Rule Library vias
Value | | Description |
---|
Via box | | Allows you to restrict the list of vias to those defined as
“allowed” in the Available padstacks
box, in the Rule
Editor Dialog: Vias tab. |
| ON | If selected, then vias are listed only if they are defined
as “allowed” in the Available padstacks
box, in the Rule
Editor Dialog: Vias tab. |
| OFF | If selected, then vias are listed that are already used in
the board. |
Via
Value | Description |
---|
Via box | Select the via that is used for testpoint generation. This
box is populated according to the selection in the Rule
Library vias field, above. |
On pattern
Value | Description |
---|
ON | A testpoint is generated on the pattern. |
OFF | A testpoint is not generated on the pattern. |
Fan-out
Value | Description |
---|
ON | Testpoints are generated around component pins. |
OFF | Testpoints are not generated around component pins. |
Select mode
Allows you to specify the type of object for which testpoints
are generated. The objects that are associated with the selected mode
are highlighted on the canvas when you point the cursor at them.
Value | Description |
---|
Normal | On the canvas, select a track or track segment, padstack, pad
or via. The button is made unavailable.
|
Net | Click and select a net in the displayed
Net dialog. Multiple
nets can be selected using the Ctrl
or Shift keys. The nets that you
select are highlighted on the canvas. Alternatively, select the
required nets by clicking them on the canvas. |
Component | On the canvas, select a component. The
button is made unavailable. |
Unconnected pin | Click and select an unconnected pin in
the displayed Unconnected pin
dialog. Multiple items can be selected using the Ctrl
or Shift keys. The components
associated with the unconnected pins that you select are highlighted
on the canvas. Alternatively, select unconnected pins by clicking
them on the canvas. |
 | - If Net
is selected in the Select mode
box, then the Net dialog is displayed when you click
this button. This dialog allows you to select a net. You can
select multiple items using the Ctrl
or Shift keys.
- If Unconnected
pin is selected in the Select
mode box, then the Unconnected
pin dialog is displayed when you click this button. The
Unconnected pin dialog allows
you to select an unconnected pin. Select multiple items
using the Ctrl or Shift
keys.
|
Around component
Value | Description |
---|
ON | If Selection mode is set to
Component, a testpoint is
generated in the vicinity of the component. |
OFF | If Selection mode is set to
Component, a testpoint is
generated in the component area. |
Testpoint side
Value | Description |
---|
Side A | Testpoints are generated on side A, when generating
on component pins. |
Side B | Testpoints are generated on side B, when generating
on component pins. |
Prioritize Side A/Prioritize Side B | When the component
placement side is side A: |
When there are pads (such as DIP components) on side B: | Generated on side B. |
When there are no pads (such as surface mount components) on
side B: | Generated on side A. |
When the component
placement side is side B: |
When there are pads (such as DIP components) on side A: | Generated on side A. |
When there are no pads (such as surface mount components) on
side A: | Generated on side B. |
DRC for testpoint
Reference name parameters
Highlight nets requiring
a testpoint
Value | Description |
---|
ON | Nets are highlighted where the number of testpoints generated
for the net is less than the number of required testpoints. |
OFF | Nets are not highlighted where the number of testpoints generated
for the net is less than the number of required testpoints. |
Value | Description |
---|
Execute | Testpoints are generated, or testpoint attributes are added.
The Auto GenerateTestpoint
dialog remains open. |
Exit | Closes the Auto GenerateTestpoint dialog without generating
testpoints or adding testpoint attributes. |